"Bias dependence of non-Fourier heat spreading in GaN HEMTs" was published on IEEE Transactions on Electron Devices
Y. Shen, X.S. Chen, Y.C. Hua, H.L. Li, L. Wei, B.Y. Cao. Bias dependence of non-Fourier heat spreading in GaN HEMTs. IEEE Transactions on Electron Devices, 2023, 70(2): 409-417 (https://ieeexplore.ieee.org/document/9991247; http://www.heatenergist.org/publication.asp)
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