Roughness dependence of phonon-interface thermal transport was published on Physical Review B
Our work on "Roughness dependence of phonon-interface thermal transport: Theoretical model and Monte Carlo simulation"was published on Physical Review B [X. Ran, B.Y. Cao. Roughness dependence of phonon-interface thermal transport: Theoretical model and Monte Carlo simulation. Physical Review B, 2024, 110: 024302].
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